Plasma Characterization Tools And Application To Reactive Sputtering Of Al-Doped Zno Thin Films

While magnetron sputtering is a commonly used tool for deposition of thin films in research & production, the development of suitable models describing film growth on the substrate progresses slowly. One of the major reasons is the complexity of the process, in which energy & particles are delivered to the substrate in a variety of ways. Nevertheless, these effects are essential for film growth & determine the quality of obtained films. In this article, an example for characterisation of a deposition process with comparably simple & cost effective tools is show. Total energy flux to the substrate is measured by a thermal probe, electron irradiation is studied by means of Langmuir probe measurements & positive ions are measured by a retarding field analyser. The results help to understand the principles of film growth & give insights on thermal load onto substrates. during deposition.

Author
Un-named
Origin
Fraunhofer-Institut Fur Schicht-Und Oberflachentechnik
Journal Title
Glass Coatings 1/2006 46-51
Sector
Special Glass
Class
S 3087

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Plasma Characterization Tools And Application To Reactive Sputtering Of Al-Doped Zno Thin Films
Glass Coatings 1/2006 46-51
S 3087
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