Comparison Of Refractive Index, Energy Dispersive X-Ray Fluorescence And Inductively Coupled Plasma Atomic Emission Spectrometry For Forensic Characterization Of Sheet Glass Fragments

Fragments (in the milligram size range) from 81 tempered sheet glasses were used in order to evaluate the source discrimination capabilities of refractive indices (RI) and elemental composition, by using energy dispersive X-ray fluorescence (EDXRF) and inductively couple plasma atomic emission spectrometry (ICP-AES. The X-ray intensities of five elements were determined by EDXRF with precisions of between 1 and 25%. The concentrations of nine elements were determined using ICP-AES and precisions of from less than 1 to about 10% were obtained. Both methods offer improved discrimination capability over RI measurements alone.

Author
R D Koons Et Al
Origin
Fbi Academy, Usa
Journal Title
J Analyt Atomic Spect 6 1991 451-456
Sector
Primary Papers
Class
PP 43

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Comparison Of Refractive Index, Energy Dispersive X-Ray Fluorescence And Inductively Coupled Plasma Atomic Emission Spectrometry For Forensic Characterization Of Sheet Glass Fragments
J Analyt Atomic Spect 6 1991 451-456
PP 43
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