Comparison Of Refractive Index, Energy Dispersive X-Ray Fluorescence & Inductively Coupled Plasma Atomic Emission Spectrometry For Forensic Characterization Of Sheet Glass Fragments

Fragments (in the milligram size range) from 81 tempered sheet glasses were used in order to evaluate the source discrimination capabilities of refractive indices (RI) and elemental composition, by using energy dispersive X-ray fluorescence (EDXRF) and inductively coupled plasma atomic emission spectrometry (ICP-AES).

Author
R D Koons Et Al
Origin
Fbi Lab, Quantico, Va, Usa
Journal Title
J Analytical Atomic Spectrometry 6 1991 451-456
Sector
Special Glass
Class
S 1263

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Comparison Of Refractive Index, Energy Dispersive X-Ray Fluorescence & Inductively Coupled Plasma Atomic Emission Spectrometry For Forensic Characterization Of Sheet Glass Fragments
J Analytical Atomic Spectrometry 6 1991 451-456
S 1263
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