The conventional open circuit voltage decay method of lifetime determination in junction structures has been modified by the addition of dc bias. This converts the decay from linear to exponential in time. Ambiguity in the junction boundary condition no longer influences the result. Application to concentrator solar cells operating over a wide range of solar intensity is discussed.
Origin
A R Moore
Journal Title
Rca Review 41 Dec 1980 549-562 Smithsonian-Nasa Astrophysics Data System
Sector
Special Glass
Class
S 3790