Raman Scattering Characterization Of Polytype In Silicon Carbide Ceramics: Comparison With X-Ray Diffraction

Raman scattering measurements have been made on SiC ceramics prepared from two powdered by sintering at different temperatures.

Author

S Nakashima Et Al

Origin

Miyazaki University, Japan

Journal Title

J Am Ceram Soc 86 5 May/03 823-829

Sector

Glass Ceramics

Class

GC 522

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Journal Title J Am Ceram Soc 86 5 May/03 823-829

Class GC 522

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