The electrical properties of glasses have been studied extensively for several years, because of their potential use in solid-state devices. Most published data on mixed electronic-ionic conduction in glasses have been interpreted in terms of an ion-polaron correlation effect, which results from the coulombic attraction between oppositely charged carriers. To have a clear understanding of the conduction mechanism, one must establish the structural basis of transport properties of such mixed conductors. In this paper a study of the electrical conductivity of the 0.5[xAg20.(1-x)V205]-0.5Te02 glassy system and an attempt to explain the results in view of the structural information obtained from X-ray photoelectron spectroscopy (XPS) is given.