Close Optical Control During Deposition

The possibility of having complete analysis of optical properties during every step of deposition was recently made possible thanks to the EpiR DA spectroscopic reflectance sensor from LayTec. With characteristics such as extreme precision and fast and highly accurate spectroscopic reflectance, this instrument ensures that thin-film coating specifications are respected.

Author
Un-named
Origin
Unknown
Journal Title
Vacuum International 1/2008 16-17
Sector
Special Glass
Class
S 3272

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Close Optical Control During Deposition
Vacuum International 1/2008 16-17
S 3272
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